High resolution quartz crystal microbalance for thin film deposition measurements /

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Bibliographic Details
Main Author: Hasan Adli Alwi
Format: Book
Language:English
Published: Manchester : University of Manchester, 1986.
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LEADER 01000nam a2200265 a 4500
003 UKM
005 20120419095500.0
008 981208s1986 xxk 000 0 eng
039 9 |a 201204190955  |b lan  |y 08-18-1999  |z load 
040 |a UKM 
090 |a QC176.83.H37 1986 4 
090 |a QC176.83  |b .H37 1986 4 
100 0 |a Hasan Adli Alwi. 
245 1 0 |a High resolution quartz crystal microbalance for thin film deposition measurements /  |c by Hasan Adli Alwi. 
260 |a Manchester :  |b University of Manchester,  |c 1986. 
300 |a 72 p. ;  |c 30 cm. 
500 |a Thesis (MSc)-University of Manchester, 1986. 
504 |a p. 71-73. 
650 0 |a Thin films 
907 |a .b1094946x  |b 28-05-21  |c 12-11-19 
998 |a t  |b 08-05-99  |c m  |d x   |e -  |f eng  |g xxk  |h 0 
914 |a vtls000098657 
991 |a Fakulti Sains Fizik dan Gunaan 
991 |a Fakulti Kejuruteraan 
945 |a QC176.83.H37 1986 4 (00008050962)  |g 1  |i 00000397035  |j 0  |l t0040  |n No. of pieces: 1  |o -  |p MYR0.00  |q -  |r -  |s -   |t 3  |u 0  |v 0  |w 0  |x 0  |y .i12188700  |z 12-11-19