Abubakkar, S. F. O. (2017). Electron radiation effects on threshold voltage and drain current characteristics of commercial power metal oxide semiconductor devices. Kulliyyah of Engineering, International Islamic University Malaysia.
توثيق أسلوب شيكاغو (الطبعة السابعة عشر)Abubakkar, Sheik Fareed Ookar. Electron Radiation Effects on Threshold Voltage and Drain Current Characteristics of Commercial Power Metal Oxide Semiconductor Devices. Kuala Lumpur: Kulliyyah of Engineering, International Islamic University Malaysia, 2017.
توثيق جمعية اللغة المعاصرة MLA (الطبعة الثامنة)Abubakkar, Sheik Fareed Ookar. Electron Radiation Effects on Threshold Voltage and Drain Current Characteristics of Commercial Power Metal Oxide Semiconductor Devices. Kulliyyah of Engineering, International Islamic University Malaysia, 2017.