Mining Test Path Signatures For Analysis And Improvement Of Microchip Testing Programs
A Test Program(TP) is constantly modified with the aim to reduce test cost. This research aims at revealing the effect of test changes on a microchip TP so that TP enhancement can be performed effectively.
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Format: | Thesis |
Published: |
2008
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Summary: | A Test Program(TP) is constantly modified with the aim to reduce test cost. This research aims at revealing the effect of test changes on a microchip TP so that TP enhancement can be performed effectively. |
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