NBTI effects on the performance of SET and DET D flip-flop topologies by using MOSRA and predictive technology models / Muhammad Fitri Zainudin
Negative Bias Temperature Instability (NBTI) is an aging mechanism that has become a key reliability issue in MOSFETs technology as well as FinFETs technology. The main reliability issues regarding the NBTI mechanism are that NBTI not only degrades the transistor electrical properties but also degra...
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| Format: | Thesis |
| Language: | English |
| Published: |
2020
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| Online Access: | https://ir.uitm.edu.my/id/eprint/59571/1/59571.pdf |
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