Md Kamal, N. (2010). Measurement of dielectric constant of silicon wafer using microwave non-destrictive testing and direct current technique / Nadia Md Kamal.
Chicago Style (17th ed.) CitationMd Kamal, Nadia. Measurement of Dielectric Constant of Silicon Wafer Using Microwave Non-destrictive Testing and Direct Current Technique / Nadia Md Kamal. 2010.
MLA引文Md Kamal, Nadia. Measurement of Dielectric Constant of Silicon Wafer Using Microwave Non-destrictive Testing and Direct Current Technique / Nadia Md Kamal. 2010.
警告：這些引文格式不一定是100％准確.