On wafer probing of monolithic microwave integrated circuit capacitors / Nor Asmah Ahmad

The purpose of this project is to measure capacitor on silicon wafer using Cascade's probe. The wafer will be measured using the RF probing technique. This project also will design the interdigital capacitor which focuses on the simulation with different length and width. The silicon has been u...

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Bibliographic Details
Main Author:	Ahmad, Nor Asmah
Format:	Thesis
Language:	English
Published:	2007
Subjects:	Microwaves Including microwave circuits
Online Access:	https://ir.uitm.edu.my/id/eprint/81109/1/81109.pdf
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id	my-uitm-ir.81109
record_format	uketd_dc
spelling	my-uitm-ir.811092023-11-20T09:19:32Z On wafer probing of monolithic microwave integrated circuit capacitors / Nor Asmah Ahmad 2007 Ahmad, Nor Asmah Microwaves. Including microwave circuits The purpose of this project is to measure capacitor on silicon wafer using Cascade's probe. The wafer will be measured using the RF probing technique. This project also will design the interdigital capacitor which focuses on the simulation with different length and width. The silicon has been used as a substrate with Er = 11.7 and thickness=300μm. The circuits were simulated using CAD packages. 2007 Thesis https://ir.uitm.edu.my/id/eprint/81109/ https://ir.uitm.edu.my/id/eprint/81109/1/81109.pdf text en public degree Universiti Teknologi MARA (UiTM) Faculty of Electrical Engineering Awang, Zaiki
institution	Universiti Teknologi MARA
collection	UiTM Institutional Repository
language	English
advisor	Awang, Zaiki
topic	Microwaves Including microwave circuits
spellingShingle	Microwaves Including microwave circuits Ahmad, Nor Asmah On wafer probing of monolithic microwave integrated circuit capacitors / Nor Asmah Ahmad
description	The purpose of this project is to measure capacitor on silicon wafer using Cascade's probe. The wafer will be measured using the RF probing technique. This project also will design the interdigital capacitor which focuses on the simulation with different length and width. The silicon has been used as a substrate with Er = 11.7 and thickness=300μm. The circuits were simulated using CAD packages.
format	Thesis
qualification_level	Bachelor degree
author	Ahmad, Nor Asmah
author_facet	Ahmad, Nor Asmah
author_sort	Ahmad, Nor Asmah
title	On wafer probing of monolithic microwave integrated circuit capacitors / Nor Asmah Ahmad
title_short	On wafer probing of monolithic microwave integrated circuit capacitors / Nor Asmah Ahmad
title_full	On wafer probing of monolithic microwave integrated circuit capacitors / Nor Asmah Ahmad
title_fullStr	On wafer probing of monolithic microwave integrated circuit capacitors / Nor Asmah Ahmad
title_full_unstemmed	On wafer probing of monolithic microwave integrated circuit capacitors / Nor Asmah Ahmad
title_sort	on wafer probing of monolithic microwave integrated circuit capacitors / nor asmah ahmad
granting_institution	Universiti Teknologi MARA (UiTM)
granting_department	Faculty of Electrical Engineering
publishDate	2007
url	https://ir.uitm.edu.my/id/eprint/81109/1/81109.pdf
_version_	1783736320700448768

On wafer probing of monolithic microwave integrated circuit capacitors / Nor Asmah Ahmad

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