Effect of high-k FinFET performance / Fatin Syamila Mohammad

Scaling down transistor to 45nm node and below might require new processing steps such as new gate stack or new device structure such as FinFET. Thus, in this work the use of high-k gate insulator - hafnium oxide (Hf02) on FinFET performance was investigated. SPICE model was used to describe the rea...

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Main Author: Mohammad, Fatin Syamila
Format: Thesis
Language:English
Published: 2013
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Online Access:https://ir.uitm.edu.my/id/eprint/98671/1/98671.pdf
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spelling my-uitm-ir.986712024-11-19T09:05:37Z Effect of high-k FinFET performance / Fatin Syamila Mohammad 2013 Mohammad, Fatin Syamila Electronics Apparatus and materials Scaling down transistor to 45nm node and below might require new processing steps such as new gate stack or new device structure such as FinFET. Thus, in this work the use of high-k gate insulator - hafnium oxide (Hf02) on FinFET performance was investigated. SPICE model was used to describe the real device operation and designing a practical analog circuit for the AC analysis. Therefore, only the gate insulator is changed in the SPICE model from silicon oxide, SiO2 to HfO2 and the difference of the turn on current (ION) is compared between planar and FinFET SiO2 gate insulator with HfO2 gate insulator FinFET transistor. The simulation results for 22nm node on inverter and chain inverter application show that better performance was obtained for FinFET compared to planar bulk CMOS. 2013 Thesis https://ir.uitm.edu.my/id/eprint/98671/ https://ir.uitm.edu.my/id/eprint/98671/1/98671.pdf text en public degree Universiti Teknologi MARA (UiTM) Faculty of Electrical Engineering Sulaiman, Suhana
institution Universiti Teknologi MARA
collection UiTM Institutional Repository
language English
advisor Sulaiman, Suhana
topic Electronics
Apparatus and materials
spellingShingle Electronics
Apparatus and materials
Mohammad, Fatin Syamila
Effect of high-k FinFET performance / Fatin Syamila Mohammad
description Scaling down transistor to 45nm node and below might require new processing steps such as new gate stack or new device structure such as FinFET. Thus, in this work the use of high-k gate insulator - hafnium oxide (Hf02) on FinFET performance was investigated. SPICE model was used to describe the real device operation and designing a practical analog circuit for the AC analysis. Therefore, only the gate insulator is changed in the SPICE model from silicon oxide, SiO2 to HfO2 and the difference of the turn on current (ION) is compared between planar and FinFET SiO2 gate insulator with HfO2 gate insulator FinFET transistor. The simulation results for 22nm node on inverter and chain inverter application show that better performance was obtained for FinFET compared to planar bulk CMOS.
format Thesis
qualification_level Bachelor degree
author Mohammad, Fatin Syamila
author_facet Mohammad, Fatin Syamila
author_sort Mohammad, Fatin Syamila
title Effect of high-k FinFET performance / Fatin Syamila Mohammad
title_short Effect of high-k FinFET performance / Fatin Syamila Mohammad
title_full Effect of high-k FinFET performance / Fatin Syamila Mohammad
title_fullStr Effect of high-k FinFET performance / Fatin Syamila Mohammad
title_full_unstemmed Effect of high-k FinFET performance / Fatin Syamila Mohammad
title_sort effect of high-k finfet performance / fatin syamila mohammad
granting_institution Universiti Teknologi MARA (UiTM)
granting_department Faculty of Electrical Engineering
publishDate 2013
url https://ir.uitm.edu.my/id/eprint/98671/1/98671.pdf
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