Junctionless transistors: parametric study with conventional doping in MOSFETS
The advancement of today technologies has been aggressively developed as the needs of current technology that becoming competitive and demanding to accommodate human lifestyle. The electronic gadgets drive the market with the requirements to provide efficient chip functionality at higher speed and e...
Saved in:
格式: | Thesis |
---|---|
语言: | English |
主题: | |
在线阅读: | http://dspace.unimap.edu.my:80/xmlui/bitstream/123456789/77894/1/Page%201-24.pdf http://dspace.unimap.edu.my:80/xmlui/bitstream/123456789/77894/2/Full%20text.pdf http://dspace.unimap.edu.my:80/xmlui/bitstream/123456789/77894/4/Nurul%20Huda.pdf |
标签: |
添加标签
没有标签, 成为第一个标记此记录!
|
相似书籍
-
Extraction of submicron mosfet parameters /
由: Seah, Kah Suan
出版: (1997) -
A study on the impact of processing parameters on low-voltage power MOSFET /
由: Nur Aqilah Othman
出版: (2012) -
The effect of doping concentration on the characteristics of n-channel MOSFET /
由: Teen, Soh Hong
出版: (2005) -
Hot-carrier studies in submicrometer SOI and conventional MOSFETs /
由: Yip, Anselm
出版: (1998) -
Heterojunction bipolar transistor (HBT) for high power applications /
由: Heng, Chun Huat
出版: (1998)