Development of Test Procedure For CMOS Operational Amplifier Application Circuits
The integrated circuit (IC) is an ultra-small and fragile electrical system. A chip is basically an IC placed in a protective black plastic casing. The only contact the outside world has with the IC is through the chips input-output and power supply pins. ICs are also prone to damage and to locat...
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| 主要作者: | |
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| 格式: | Thesis |
| 語言: | English English |
| 出版: |
2002
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| 主題: | |
| 在線閱讀: | http://psasir.upm.edu.my/id/eprint/10476/1/FK_2002_8.pdf |
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