Development of a Functional Digital Integrated Circuit Testing System Using Mixed-Mode Technique
With the continuous increase in design complexities and packing densities of integrated circuit (IC), problems associated with conventional Automatic Test Equipment (ATE)-based IC testing approach have become a burning issue in the semiconductor world, which needs an economic solution with reliable...
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| 格式: | Thesis |
| 语言: | English English |
| 出版: |
2004
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| 在线阅读: | http://psasir.upm.edu.my/id/eprint/380/1/549750_fk_2004_61_abstrak_je_%28dh_pdf%29.pdf |
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