Scan Test Coverage Improvement Via Automatic Test Pattern Generation (Atpg) Tool Configuration

The scan test coverage improvement by using automatic test pattern generation (ATPG) tool configuration was investigated. Improving the test coverage is essential in detecting manufacturing defects in semiconductor industry so that high quality products can be supplied to consumers. The ATPG tool us...

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Main Author:	Salehuddin, Muhammad Redzwan
Format:	Thesis
Language:	English
Published:	2017
Subjects:	TK1-9971 Electrical engineering Electronics Nuclear engineering
Online Access:	http://eprints.usm.my/39652/1/MUHAMMAD_REDZWAN_BIN_SALEHUDDIN_24_Pages.pdf
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id	my-usm-ep.39652
record_format	uketd_dc
spelling	my-usm-ep.396522019-04-12T05:25:05Z Scan Test Coverage Improvement Via Automatic Test Pattern Generation (Atpg) Tool Configuration 2017 Salehuddin, Muhammad Redzwan TK1-9971 Electrical engineering. Electronics. Nuclear engineering The scan test coverage improvement by using automatic test pattern generation (ATPG) tool configuration was investigated. Improving the test coverage is essential in detecting manufacturing defects in semiconductor industry so that high quality products can be supplied to consumers. The ATPG tool used was Mentor Graphics Tessent TestKompress (version 2014.1). The study was done by setting up a few experiments of utilizing and modifying ATPG commands and switches, observing the test coverage improvement from the statistical reports provided during pattern generation process and providing relatable discussions. By modifying the ATPG commands, it can be expected to have some improvement in the test coverage. The scan test patterns generated were stuck-at test patterns. Based on the experiments done, comparison was made on the different coverage readings and the most optimized method and flow of ATPG were determined. The most optimized flow gave an improvement of 0.91% in test coverage which is acceptable since this method does not involve a change in design. The test patterns generated were converted and tested using automatic test equipment (ATE) to observe its performance on real silicon. The test coverage improvement using ATPG tool instead of the design-based method is important as a faster workaround for back-end engineers to provide high quality test contents in such a short product development duration. 2017 Thesis http://eprints.usm.my/39652/ http://eprints.usm.my/39652/1/MUHAMMAD_REDZWAN_BIN_SALEHUDDIN_24_Pages.pdf application/pdf en public masters Universiti Sains Malaysia Pusat Pengajian Kejuruteraan Elektrik dan Elektronik
institution	Universiti Sains Malaysia
collection	USM Institutional Repository
language	English
topic	TK1-9971 Electrical engineering Electronics Nuclear engineering
spellingShingle	TK1-9971 Electrical engineering Electronics Nuclear engineering Salehuddin, Muhammad Redzwan Scan Test Coverage Improvement Via Automatic Test Pattern Generation (Atpg) Tool Configuration
description	The scan test coverage improvement by using automatic test pattern generation (ATPG) tool configuration was investigated. Improving the test coverage is essential in detecting manufacturing defects in semiconductor industry so that high quality products can be supplied to consumers. The ATPG tool used was Mentor Graphics Tessent TestKompress (version 2014.1). The study was done by setting up a few experiments of utilizing and modifying ATPG commands and switches, observing the test coverage improvement from the statistical reports provided during pattern generation process and providing relatable discussions. By modifying the ATPG commands, it can be expected to have some improvement in the test coverage. The scan test patterns generated were stuck-at test patterns. Based on the experiments done, comparison was made on the different coverage readings and the most optimized method and flow of ATPG were determined. The most optimized flow gave an improvement of 0.91% in test coverage which is acceptable since this method does not involve a change in design. The test patterns generated were converted and tested using automatic test equipment (ATE) to observe its performance on real silicon. The test coverage improvement using ATPG tool instead of the design-based method is important as a faster workaround for back-end engineers to provide high quality test contents in such a short product development duration.
format	Thesis
qualification_level	Master's degree
author	Salehuddin, Muhammad Redzwan
author_facet	Salehuddin, Muhammad Redzwan
author_sort	Salehuddin, Muhammad Redzwan
title	Scan Test Coverage Improvement Via Automatic Test Pattern Generation (Atpg) Tool Configuration
title_short	Scan Test Coverage Improvement Via Automatic Test Pattern Generation (Atpg) Tool Configuration
title_full	Scan Test Coverage Improvement Via Automatic Test Pattern Generation (Atpg) Tool Configuration
title_fullStr	Scan Test Coverage Improvement Via Automatic Test Pattern Generation (Atpg) Tool Configuration
title_full_unstemmed	Scan Test Coverage Improvement Via Automatic Test Pattern Generation (Atpg) Tool Configuration
title_sort	scan test coverage improvement via automatic test pattern generation (atpg) tool configuration
granting_institution	Universiti Sains Malaysia
granting_department	Pusat Pengajian Kejuruteraan Elektrik dan Elektronik
publishDate	2017
url	http://eprints.usm.my/39652/1/MUHAMMAD_REDZWAN_BIN_SALEHUDDIN_24_Pages.pdf
_version_	1747820763534065664

Scan Test Coverage Improvement Via Automatic Test Pattern Generation (Atpg) Tool Configuration

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