On-wafer noise figure characterization for radio frequency integrated circuits.
Kaedah nyah-benaman pengukuran Angka Hingar (AH) atas-wafer untuk Litar Bersepadu Frekuensi Radio (LBFR) dibentangkan dalam tesis ini. Ini diikuti dengan analisa ketakpastian gandaan untuk menyiasat pengaruh pengukuran skalar dan vektor terhadap AH. A de-embedding method of an on-wafer Noise Figu...
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2011
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my-usm-ep.411032018-07-26T06:51:07Z On-wafer noise figure characterization for radio frequency integrated circuits. 2011-03 Mohd, Shukri Korakkottil Kunhi TK1-9971 Electrical engineering. Electronics. Nuclear engineering Kaedah nyah-benaman pengukuran Angka Hingar (AH) atas-wafer untuk Litar Bersepadu Frekuensi Radio (LBFR) dibentangkan dalam tesis ini. Ini diikuti dengan analisa ketakpastian gandaan untuk menyiasat pengaruh pengukuran skalar dan vektor terhadap AH. A de-embedding method of an on-wafer Noise Figure (NF) measurement for Radio Frequency Integrated Circuit (RFIC) is presented in this thesis. This is then followed by gain uncertainty analysis to investigate the influences of scalar and vector measurements on the NF. 2011-03 Thesis http://eprints.usm.my/41103/ http://eprints.usm.my/41103/1/On-wafer_noise_figure_characterization_for_radio_frequency_integrated_circuits..pdf application/pdf en public masters Universiti Sains Malaysia Pusat Pengajian Kejuruteraan Elektrik Dan Elektronik |
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Universiti Sains Malaysia |
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USM Institutional Repository |
language |
English |
topic |
TK1-9971 Electrical engineering Electronics Nuclear engineering |
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TK1-9971 Electrical engineering Electronics Nuclear engineering Mohd, Shukri Korakkottil Kunhi On-wafer noise figure characterization for radio frequency integrated circuits. |
description |
Kaedah nyah-benaman pengukuran Angka Hingar (AH) atas-wafer untuk Litar Bersepadu Frekuensi Radio (LBFR) dibentangkan dalam tesis ini. Ini diikuti dengan analisa ketakpastian gandaan untuk menyiasat pengaruh pengukuran skalar dan vektor terhadap AH.
A de-embedding method of an on-wafer Noise Figure (NF) measurement for Radio Frequency Integrated Circuit (RFIC) is presented in this thesis. This is then followed by gain uncertainty analysis to investigate the influences of scalar and vector measurements on the NF.
|
format |
Thesis |
qualification_level |
Master's degree |
author |
Mohd, Shukri Korakkottil Kunhi |
author_facet |
Mohd, Shukri Korakkottil Kunhi |
author_sort |
Mohd, Shukri Korakkottil Kunhi |
title |
On-wafer noise figure characterization for radio frequency integrated circuits. |
title_short |
On-wafer noise figure characterization for radio frequency integrated circuits. |
title_full |
On-wafer noise figure characterization for radio frequency integrated circuits. |
title_fullStr |
On-wafer noise figure characterization for radio frequency integrated circuits. |
title_full_unstemmed |
On-wafer noise figure characterization for radio frequency integrated circuits. |
title_sort |
on-wafer noise figure characterization for radio frequency integrated circuits. |
granting_institution |
Universiti Sains Malaysia |
granting_department |
Pusat Pengajian Kejuruteraan Elektrik Dan Elektronik |
publishDate |
2011 |
url |
http://eprints.usm.my/41103/1/On-wafer_noise_figure_characterization_for_radio_frequency_integrated_circuits..pdf |
_version_ |
1747820875584897024 |