Post-Silicon General Bus Function Model Modelling Approach Using C Code For Test Scheme Reuse And Sharing

Short product life cycle of a semiconductor IC is crucial for a company to gain better market share. But current validation process has become one of the bottleneck in semiconductor IC development process, where enhancement in this area can reduce the product lead time to market. There is a gap betw...

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Main Author:	Chang , Ling Kwai
Format:	Thesis
Language:	English
Published:	2014
Subjects:	TK7800-8360 Electronics
Online Access:	http://eprints.usm.my/41146/1/CHANG_LING_KWAI_24_Pages.pdf
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id	my-usm-ep.41146
record_format	uketd_dc
spelling	my-usm-ep.411462018-07-25T02:54:03Z Post-Silicon General Bus Function Model Modelling Approach Using C Code For Test Scheme Reuse And Sharing 2014 Chang , Ling Kwai TK7800-8360 Electronics Short product life cycle of a semiconductor IC is crucial for a company to gain better market share. But current validation process has become one of the bottleneck in semiconductor IC development process, where enhancement in this area can reduce the product lead time to market. There is a gap between pre- and post-silicon where both area is doing similar things but in different environment. A way to bridge the gap is by using the same test scheme which is applicable for both environment. This paper discuss and come out with an approach on how to model post-silicon BFM using high level programming language (C code) that is capable of content sharing and reuse between both pre- and post-silicon validation. Two methods to model post-silicon BFM are being approached and the more suitable one is being selected. The comparison is done is aspect of meeting strict timing requirement in sending signal. A prototype model of the selected model, which is second model is developed and tested in post-silicon validation environment to prove validity of the design. Test content in C code is created and synthesize into FPGA, act as stimulus generator for validation. The BFM device bit-accuracy behavior of the modelled Audio bus protocol is checked with waveform and signal trace. With this working model for developing BFM, pre- and post-silicon validation can share the same test scheme, saving efforts and time of developing test devices. 2014 Thesis http://eprints.usm.my/41146/ http://eprints.usm.my/41146/1/CHANG_LING_KWAI_24_Pages.pdf application/pdf en public masters Universiti Sains Malaysia Pusat Pengajian Kejuruteraan Elektrik dan Elektronik
institution	Universiti Sains Malaysia
collection	USM Institutional Repository
language	English
topic	TK7800-8360 Electronics
spellingShingle	TK7800-8360 Electronics Chang , Ling Kwai Post-Silicon General Bus Function Model Modelling Approach Using C Code For Test Scheme Reuse And Sharing
description	Short product life cycle of a semiconductor IC is crucial for a company to gain better market share. But current validation process has become one of the bottleneck in semiconductor IC development process, where enhancement in this area can reduce the product lead time to market. There is a gap between pre- and post-silicon where both area is doing similar things but in different environment. A way to bridge the gap is by using the same test scheme which is applicable for both environment. This paper discuss and come out with an approach on how to model post-silicon BFM using high level programming language (C code) that is capable of content sharing and reuse between both pre- and post-silicon validation. Two methods to model post-silicon BFM are being approached and the more suitable one is being selected. The comparison is done is aspect of meeting strict timing requirement in sending signal. A prototype model of the selected model, which is second model is developed and tested in post-silicon validation environment to prove validity of the design. Test content in C code is created and synthesize into FPGA, act as stimulus generator for validation. The BFM device bit-accuracy behavior of the modelled Audio bus protocol is checked with waveform and signal trace. With this working model for developing BFM, pre- and post-silicon validation can share the same test scheme, saving efforts and time of developing test devices.
format	Thesis
qualification_level	Master's degree
author	Chang , Ling Kwai
author_facet	Chang , Ling Kwai
author_sort	Chang , Ling Kwai
title	Post-Silicon General Bus Function Model Modelling Approach Using C Code For Test Scheme Reuse And Sharing
title_short	Post-Silicon General Bus Function Model Modelling Approach Using C Code For Test Scheme Reuse And Sharing
title_full	Post-Silicon General Bus Function Model Modelling Approach Using C Code For Test Scheme Reuse And Sharing
title_fullStr	Post-Silicon General Bus Function Model Modelling Approach Using C Code For Test Scheme Reuse And Sharing
title_full_unstemmed	Post-Silicon General Bus Function Model Modelling Approach Using C Code For Test Scheme Reuse And Sharing
title_sort	post-silicon general bus function model modelling approach using c code for test scheme reuse and sharing
granting_institution	Universiti Sains Malaysia
granting_department	Pusat Pengajian Kejuruteraan Elektrik dan Elektronik
publishDate	2014
url	http://eprints.usm.my/41146/1/CHANG_LING_KWAI_24_Pages.pdf
_version_	1747820882420563968

Post-Silicon General Bus Function Model Modelling Approach Using C Code For Test Scheme Reuse And Sharing

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