Simultaneous Switching Noise Impact To Signal Sensitivity On Usb 2.0

Simultaneous Switching Noise (SSN) is increasing with higher I/O data rate, resulting into challenges for regulating supply voltage in typical transistor circuit. Supply voltage changes accordingly with Power Distribution Network (PDN) design. Engineering efforts are focused on PDN layout to minimiz...

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主要作者: Chan, Siang Rui
格式: Thesis
語言:English
出版: 2013
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spelling my-usm-ep.432682019-04-12T05:26:12Z Simultaneous Switching Noise Impact To Signal Sensitivity On Usb 2.0 2013-06 Chan, Siang Rui TK1-9971 Electrical engineering. Electronics. Nuclear engineering Simultaneous Switching Noise (SSN) is increasing with higher I/O data rate, resulting into challenges for regulating supply voltage in typical transistor circuit. Supply voltage changes accordingly with Power Distribution Network (PDN) design. Engineering efforts are focused on PDN layout to minimize the impedance path. However, the desire to miniaturize components on a system increases design challenges to control voltage drop via comprehensive PDN design. Hence, it is a need to study the impact of supply noise to signal performance in future PDN design. Instead of optimizing PDN, a different way of quantifying different frequency supply voltage impact to output signal is introduced in this research. In order to observe this relationship, Universal Serial Bus (USB) transmitter circuit signal performance is explored. Signal eye diagram is observed by replacing DC input voltage with various frequencies of AC input voltage. From the simulation, USB transmitter has better immunity to the supply noise at its operating frequency of 480 MHz, and also its harmonic frequencies of 960 MHz and 1.44 GHz. Excessive amount of supply noises at these frequencies are not causing signal eye diagram to fail. This finding is further verified by lab measurement. Eye diagram is measured by different simultaneous switching stress test cases. The supply voltage is captured and analyzed using Fast Fourier Transform (FFT) to identify the major frequency contributors in the noise profile. From the measurement result, signal has better performance especially when the measured supply noise falls in the frequency regions of 480 MHz and 960 MHz. 2013-06 Thesis http://eprints.usm.my/43268/ http://eprints.usm.my/43268/1/Chan%20Siang%20Rui24.pdf application/pdf en public masters Universiti Sains Malaysia Pusat Pengajian Kejuruteraan Elektrik & Elektronik
institution Universiti Sains Malaysia
collection USM Institutional Repository
language English
topic TK1-9971 Electrical engineering
Electronics
Nuclear engineering
spellingShingle TK1-9971 Electrical engineering
Electronics
Nuclear engineering
Chan, Siang Rui
Simultaneous Switching Noise Impact To Signal Sensitivity On Usb 2.0
description Simultaneous Switching Noise (SSN) is increasing with higher I/O data rate, resulting into challenges for regulating supply voltage in typical transistor circuit. Supply voltage changes accordingly with Power Distribution Network (PDN) design. Engineering efforts are focused on PDN layout to minimize the impedance path. However, the desire to miniaturize components on a system increases design challenges to control voltage drop via comprehensive PDN design. Hence, it is a need to study the impact of supply noise to signal performance in future PDN design. Instead of optimizing PDN, a different way of quantifying different frequency supply voltage impact to output signal is introduced in this research. In order to observe this relationship, Universal Serial Bus (USB) transmitter circuit signal performance is explored. Signal eye diagram is observed by replacing DC input voltage with various frequencies of AC input voltage. From the simulation, USB transmitter has better immunity to the supply noise at its operating frequency of 480 MHz, and also its harmonic frequencies of 960 MHz and 1.44 GHz. Excessive amount of supply noises at these frequencies are not causing signal eye diagram to fail. This finding is further verified by lab measurement. Eye diagram is measured by different simultaneous switching stress test cases. The supply voltage is captured and analyzed using Fast Fourier Transform (FFT) to identify the major frequency contributors in the noise profile. From the measurement result, signal has better performance especially when the measured supply noise falls in the frequency regions of 480 MHz and 960 MHz.
format Thesis
qualification_level Master's degree
author Chan, Siang Rui
author_facet Chan, Siang Rui
author_sort Chan, Siang Rui
title Simultaneous Switching Noise Impact To Signal Sensitivity On Usb 2.0
title_short Simultaneous Switching Noise Impact To Signal Sensitivity On Usb 2.0
title_full Simultaneous Switching Noise Impact To Signal Sensitivity On Usb 2.0
title_fullStr Simultaneous Switching Noise Impact To Signal Sensitivity On Usb 2.0
title_full_unstemmed Simultaneous Switching Noise Impact To Signal Sensitivity On Usb 2.0
title_sort simultaneous switching noise impact to signal sensitivity on usb 2.0
granting_institution Universiti Sains Malaysia
granting_department Pusat Pengajian Kejuruteraan Elektrik & Elektronik
publishDate 2013
url http://eprints.usm.my/43268/1/Chan%20Siang%20Rui24.pdf
_version_ 1747821190240534528