Surface And Interface Phonon Polariton Characteristics Of Wurtzite ZnO-Based Semiconductor By Infrared Attenuated Total Reflection Spectroscopy

Studies of surface phonon polariton (SPP) characteristics of wurtzite zinc oxide (ZnO) based semiconductors were reported. Attention was paid on the investigations of the SPP and also the interface phonon polariton (IPP) modes in the ZnO heterostructure systems. For comparison, the SPP mode in the b...

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Main Author: Lee, Sai Cheong
Format: Thesis
Language:English
Published: 2011
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Online Access:http://eprints.usm.my/43360/1/LEE%20SAI%20CHEONG.pdf
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spelling my-usm-ep.433602019-04-12T05:26:31Z Surface And Interface Phonon Polariton Characteristics Of Wurtzite ZnO-Based Semiconductor By Infrared Attenuated Total Reflection Spectroscopy 2011-09 Lee, Sai Cheong QC1 Physics (General) Studies of surface phonon polariton (SPP) characteristics of wurtzite zinc oxide (ZnO) based semiconductors were reported. Attention was paid on the investigations of the SPP and also the interface phonon polariton (IPP) modes in the ZnO heterostructure systems. For comparison, the SPP mode in the bulk ZnO crystal was also investigated. The early effort started with the derivation of the surface polariton (SP) dispersion relations for wurtzite based multilayer systems. The obtained formulations were applied to investigate the dispersion properties of the SPP and IPP modes in the bulk ZnO crystal, ZnO thin film on 6H-SiC substrate, and ZnO/GaN heterostructure on 6H-SiC substrate. 2011-09 Thesis http://eprints.usm.my/43360/ http://eprints.usm.my/43360/1/LEE%20SAI%20CHEONG.pdf application/pdf en public masters Universiti Sains Malaysia Pusat Pengajian Sains Fizik
institution Universiti Sains Malaysia
collection USM Institutional Repository
language English
topic QC1 Physics (General)
spellingShingle QC1 Physics (General)
Lee, Sai Cheong
Surface And Interface Phonon Polariton Characteristics Of Wurtzite ZnO-Based Semiconductor By Infrared Attenuated Total Reflection Spectroscopy
description Studies of surface phonon polariton (SPP) characteristics of wurtzite zinc oxide (ZnO) based semiconductors were reported. Attention was paid on the investigations of the SPP and also the interface phonon polariton (IPP) modes in the ZnO heterostructure systems. For comparison, the SPP mode in the bulk ZnO crystal was also investigated. The early effort started with the derivation of the surface polariton (SP) dispersion relations for wurtzite based multilayer systems. The obtained formulations were applied to investigate the dispersion properties of the SPP and IPP modes in the bulk ZnO crystal, ZnO thin film on 6H-SiC substrate, and ZnO/GaN heterostructure on 6H-SiC substrate.
format Thesis
qualification_level Master's degree
author Lee, Sai Cheong
author_facet Lee, Sai Cheong
author_sort Lee, Sai Cheong
title Surface And Interface Phonon Polariton Characteristics Of Wurtzite ZnO-Based Semiconductor By Infrared Attenuated Total Reflection Spectroscopy
title_short Surface And Interface Phonon Polariton Characteristics Of Wurtzite ZnO-Based Semiconductor By Infrared Attenuated Total Reflection Spectroscopy
title_full Surface And Interface Phonon Polariton Characteristics Of Wurtzite ZnO-Based Semiconductor By Infrared Attenuated Total Reflection Spectroscopy
title_fullStr Surface And Interface Phonon Polariton Characteristics Of Wurtzite ZnO-Based Semiconductor By Infrared Attenuated Total Reflection Spectroscopy
title_full_unstemmed Surface And Interface Phonon Polariton Characteristics Of Wurtzite ZnO-Based Semiconductor By Infrared Attenuated Total Reflection Spectroscopy
title_sort surface and interface phonon polariton characteristics of wurtzite zno-based semiconductor by infrared attenuated total reflection spectroscopy
granting_institution Universiti Sains Malaysia
granting_department Pusat Pengajian Sains Fizik
publishDate 2011
url http://eprints.usm.my/43360/1/LEE%20SAI%20CHEONG.pdf
_version_ 1747821199520432128