Investigation Of OLED Performance In Non-Operated Mode Subjected To High Thermal Stress And Hygrothermal Aging

Investigation Of OLED Performance In Non-Operated Mode Subjected To High Thermal Stress And Hygrothermal Aging

The attention towards organic light emitting diodes (OLEDs) has remarkably increased in recent years due to numerous advantages offered. However, the degradation issues responsible for the short lifetime of the devices, particularly after being exposed to high temperature and humidity has yet to be...

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Main Author: Mohammad, Muhammad Azrain
Format: Thesis
Language:English
English
Published: 2019
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T Technology (General)
Online Access:http://eprints.utem.edu.my/id/eprint/24851/1/Investigation%20Of%20Oled%20Performance%20In%20Non-Operated%20Mode%20Subjected%20To%20High%20Thermal%20Stress%20And%20Hygrothermal%20Aging.pdf
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institution Universiti Teknikal Malaysia Melaka
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topic T Technology (General)
T Technology (General)
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T Technology (General)
Mohammad, Muhammad Azrain
Investigation Of OLED Performance In Non-Operated Mode Subjected To High Thermal Stress And Hygrothermal Aging
description The attention towards organic light emitting diodes (OLEDs) has remarkably increased in recent years due to numerous advantages offered. However, the degradation issues responsible for the short lifetime of the devices, particularly after being exposed to high temperature and humidity has yet to be hlly established, even with the invention of encapsulation layers. The root cause of OLED degradations may also be diverse, and hence, involving the outcomes and failure mechanisms. Therefore, a comprehensive knowledge on this particular subject is essentially important as it is the key to unravel the short lifetime issues of OLEDs. Hence, the main purpose of this research is to study the OLED performance subjected to high thermal stress and hygrotherrnal effect, specifically via non-operated mode. Nonetheless, an optimum discharge time must first be acquired to ensure that the parasitic capacitance (due to thin structure of the OLEDs) can be fully eliminated for the purpose of data validity. In this study, a batch of commercially-available OLEDs has been employed. An onloff cycles approach was employed in which the OLED samples were switched-on (Ton) and -off (To&) at a specific time in determining the optimum discharge time. For high thermal test, the OLEDs were subjected to several temperatures in a controlled oven, including temperatures higher than the glass transition temperature (Tg) of the polymer material (-126 "C). Whilst in the hygrothermal aging test, the OLEDs were exposed to 85 OC and 85% RH in a humidity chamber at: different exposure time. A black box and a chroma-meter were used to monitor the changes in the luminance and voltagedrop values, while an interlayer analysis was performed by using focused ion beam (FIB) and field emission scanning electron microscope (FESEM) equipment. For this particular OLED, the optimum discharge time was found to be at Toff40 S. AS for high thermal test, it was observed that the luminance value has dramatically dropped by 90% fiom the initial value after the OLEDs were stressed at 135 OC, while the voltage-drop greatly escalated fiom 8.5 V to 30.2 V. The presence of voids between the layers were also evident due to the interfacial thermal stress. The voids have allowed the infiltration of moisture and oxygen into the device and eventually led to the formation of bubble-like defects on top of the cathode's surface. This condition has resulted in deterioration of electrons injection path and permanently changed the morphological structures of the devices. Through calculations, it was verified that the interfacial thermal stress between the layers can be reduced about 50% as the thickness of the polymer layer was increased by two times of its initial dimension. While in hygrothermal aging test, two primary modes of failure were observed. The first process involves the formation of centered-burst defects, and the second mode is the ringshaped delamination of cathode film. Essentially, both failure modes have destroyed the entire aluminum film and permanently changed the morphological surface of the device which has led to the total failure of the device. As a conclusion, the findings of this study profoundly emphasized on the performance and failure behaviors in OLED under extreme conditions, specifically via non-operated mode.
format Thesis
qualification_name Master of Philosophy (M.Phil.)
qualification_level Master's degree
author Mohammad, Muhammad Azrain
author_facet Mohammad, Muhammad Azrain
author_sort Mohammad, Muhammad Azrain
title Investigation Of OLED Performance In Non-Operated Mode Subjected To High Thermal Stress And Hygrothermal Aging
title_short Investigation Of OLED Performance In Non-Operated Mode Subjected To High Thermal Stress And Hygrothermal Aging
title_full Investigation Of OLED Performance In Non-Operated Mode Subjected To High Thermal Stress And Hygrothermal Aging
title_fullStr Investigation Of OLED Performance In Non-Operated Mode Subjected To High Thermal Stress And Hygrothermal Aging
title_full_unstemmed Investigation Of OLED Performance In Non-Operated Mode Subjected To High Thermal Stress And Hygrothermal Aging
title_sort investigation of oled performance in non-operated mode subjected to high thermal stress and hygrothermal aging
granting_institution Universiti Teknikal Malaysia Melaka
granting_department Faculty Of Mechanical Engineering
publishDate 2019
url http://eprints.utem.edu.my/id/eprint/24851/1/Investigation%20Of%20Oled%20Performance%20In%20Non-Operated%20Mode%20Subjected%20To%20High%20Thermal%20Stress%20And%20Hygrothermal%20Aging.pdf
http://eprints.utem.edu.my/id/eprint/24851/2/Investigation%20Of%20Oled%20Performance%20In%20Non-Operated%20Mode%20Subjected%20To%20High%20Thermal%20Stress%20And%20Hygrothermal%20Aging.pdf
_version_ 1747834096301637632
spelling my-utem-ep.248512022-03-30T07:57:43Z Investigation Of OLED Performance In Non-Operated Mode Subjected To High Thermal Stress And Hygrothermal Aging 2019 Mohammad, Muhammad Azrain T Technology (General) TK Electrical engineering. Electronics Nuclear engineering The attention towards organic light emitting diodes (OLEDs) has remarkably increased in recent years due to numerous advantages offered. However, the degradation issues responsible for the short lifetime of the devices, particularly after being exposed to high temperature and humidity has yet to be hlly established, even with the invention of encapsulation layers. The root cause of OLED degradations may also be diverse, and hence, involving the outcomes and failure mechanisms. Therefore, a comprehensive knowledge on this particular subject is essentially important as it is the key to unravel the short lifetime issues of OLEDs. Hence, the main purpose of this research is to study the OLED performance subjected to high thermal stress and hygrotherrnal effect, specifically via non-operated mode. Nonetheless, an optimum discharge time must first be acquired to ensure that the parasitic capacitance (due to thin structure of the OLEDs) can be fully eliminated for the purpose of data validity. In this study, a batch of commercially-available OLEDs has been employed. An onloff cycles approach was employed in which the OLED samples were switched-on (Ton) and -off (To&) at a specific time in determining the optimum discharge time. For high thermal test, the OLEDs were subjected to several temperatures in a controlled oven, including temperatures higher than the glass transition temperature (Tg) of the polymer material (-126 "C). Whilst in the hygrothermal aging test, the OLEDs were exposed to 85 OC and 85% RH in a humidity chamber at: different exposure time. A black box and a chroma-meter were used to monitor the changes in the luminance and voltagedrop values, while an interlayer analysis was performed by using focused ion beam (FIB) and field emission scanning electron microscope (FESEM) equipment. For this particular OLED, the optimum discharge time was found to be at Toff40 S. AS for high thermal test, it was observed that the luminance value has dramatically dropped by 90% fiom the initial value after the OLEDs were stressed at 135 OC, while the voltage-drop greatly escalated fiom 8.5 V to 30.2 V. The presence of voids between the layers were also evident due to the interfacial thermal stress. The voids have allowed the infiltration of moisture and oxygen into the device and eventually led to the formation of bubble-like defects on top of the cathode's surface. This condition has resulted in deterioration of electrons injection path and permanently changed the morphological structures of the devices. Through calculations, it was verified that the interfacial thermal stress between the layers can be reduced about 50% as the thickness of the polymer layer was increased by two times of its initial dimension. While in hygrothermal aging test, two primary modes of failure were observed. The first process involves the formation of centered-burst defects, and the second mode is the ringshaped delamination of cathode film. Essentially, both failure modes have destroyed the entire aluminum film and permanently changed the morphological surface of the device which has led to the total failure of the device. As a conclusion, the findings of this study profoundly emphasized on the performance and failure behaviors in OLED under extreme conditions, specifically via non-operated mode. 2019 Thesis http://eprints.utem.edu.my/id/eprint/24851/ http://eprints.utem.edu.my/id/eprint/24851/1/Investigation%20Of%20Oled%20Performance%20In%20Non-Operated%20Mode%20Subjected%20To%20High%20Thermal%20Stress%20And%20Hygrothermal%20Aging.pdf text en public http://eprints.utem.edu.my/id/eprint/24851/2/Investigation%20Of%20Oled%20Performance%20In%20Non-Operated%20Mode%20Subjected%20To%20High%20Thermal%20Stress%20And%20Hygrothermal%20Aging.pdf text en validuser https://plh.utem.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=116984 mphil masters Universiti Teknikal Malaysia Melaka Faculty Of Mechanical Engineering Mansor, Muhd Ridzuan 1. Adachi, C., Nagai, K. and Tamoto, N., 1995. Molecular Design of Hole Transport Materials for Obtaining High Durability in Organic Electroluminescent Diodes. 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