Thermosonic micro-interconnections: Interfacial Cu-Al intermetallics compound growth studies based on stress modelling
One of the most common wire bonding technology involving copper (Cu) wire interconnections is the thermosonic bonding technique. Still, the volumetric changes of intermetallic compounds (IMCs) formed at the bonding interface of Cu wire on Al bond pads induce voids formation in the Cu-Al IMC layer. T...
Saved in:
相似書籍
-
The micro-structural characterization of thermosonic cu-al intermetallic compounds and modelling of its interface stress
由: Chua, Kok Yau
出版: (2015) -
Modelling Of Wire Bonding Cu-Al Intermetallic Formation Growth Towards Interfacial Stress
由: Lee, Cher Chia
出版: (2017) -
Effects of metallic nanoparticle doped flux on morphology and growth of interfacial intermetallic compounds between Sn-Ag-Cu solder and copper substrate /
由: Ghosh, Sujan Kumer
出版: (2015) -
Effect Of Zn Addition On Microstructure, Intermetallic Compound Formation And Mechanical Properties Of Sn-0.7cu Solder On Cu Substrate
由: Ghani, Fitriah Abdul
出版: (2018) -
Dynamic fracture process of solder/intermetallic interface in lead-free solder interconnects using cohesive zone model
由: Mohd. Yamin, Aliff Farhan
出版: (2012)
