APA引文

Abdullah, F. (2013). Technique of failure analysis for gate oxide defect of Bi-polar CMOS Diffuse (BCD) technology.

Chicago Style (17th ed.) Citation

Abdullah, Farisal. Technique of Failure Analysis for Gate Oxide Defect of Bi-polar CMOS Diffuse (BCD) Technology. 2013.

MLA引文

Abdullah, Farisal. Technique of Failure Analysis for Gate Oxide Defect of Bi-polar CMOS Diffuse (BCD) Technology. 2013.

警告：這些引文格式不一定是100％准確.