APA (7th ed.) Citation

Abdullah, F. (2013). Technique of failure analysis for gate oxide defect of Bi-polar CMOS Diffuse (BCD) technology.

Chicago Style (17th ed.) Citation

Abdullah, Farisal. Technique of Failure Analysis for Gate Oxide Defect of Bi-polar CMOS Diffuse (BCD) Technology. 2013.

MLA (8th ed.) Citation

Abdullah, Farisal. Technique of Failure Analysis for Gate Oxide Defect of Bi-polar CMOS Diffuse (BCD) Technology. 2013.

Warning: These citations may not always be 100% accurate.