Enhanced configurable 2-d linear feedback shift register with maximal length

Integrated circuit (IC) testing is one of the important steps in IC manufacturing. In IC testing, various methods have been developed to generate test patterns for testing purposes. Linear feedback shift register (LFSR) is one of the famous methods with easy implementation and uses little gate count...

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主要作者: Wong, Kue Fong
格式: Thesis
出版: 2011
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