Iterative diagnosis to improve diagnostic resolution

The area of research is the study of iterative diagnosis. Diagnosis to find faults in semiconductor devices is a well researched field, with most logic diagnosis efforts using the inject-and-evaluate algorithm. However, most diagnosis tools are unable to resolve faults to a single gate/device. Becau...

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Main Author:	Chuah, Andrew Hooi Leong
Format:	Thesis
Language:	English
Published:	2013
Subjects:	TK Electrical engineering Electronics Nuclear engineering
Online Access:	http://eprints.utm.my/id/eprint/33800/5/AndrewChuahHooiLeongMFKE2013.pdf
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id	my-utm-ep.33800
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spelling	my-utm-ep.338002017-09-11T03:07:36Z Iterative diagnosis to improve diagnostic resolution 2013-01 Chuah, Andrew Hooi Leong TK Electrical engineering. Electronics Nuclear engineering The area of research is the study of iterative diagnosis. Diagnosis to find faults in semiconductor devices is a well researched field, with most logic diagnosis efforts using the inject-and-evaluate algorithm. However, most diagnosis tools are unable to resolve faults to a single gate/device. Because of this, fault isolation (FI) engineers are forced to use probing techniques such as IREM logic state imaging (LSI) in order to further isolate the fault to the gate/device level before performing failure analysis. The current method of selecting probe sites is simply to take the list of fault candidates and probe them sequentially or by determining the optimal probe order through manual analysis of the circuit cone. However, in cases where a large list of fault candidates are returned by the diagnosis tool, it is difficult to manually analyze the fault cone as it is too large and complex. This work implements a basic algorithm which allows the diagnosis tool to recommend probe candidates, read in the result of the probe, and continue this cycle iteratively until the fault is fully isolated to a single gate/device. The algorithm is based on a binary search, and shows that a 5-6X reduction in the amount of probing needed can be achieved if the diagnosis tool is used iteratively in the fault isolation flow. 2013-01 Thesis http://eprints.utm.my/id/eprint/33800/ http://eprints.utm.my/id/eprint/33800/5/AndrewChuahHooiLeongMFKE2013.pdf application/pdf en public masters Universiti Teknologi Malaysia, Faculty of Electrical Engineering Faculty of Electrical Engineering
institution	Universiti Teknologi Malaysia
collection	UTM Institutional Repository
language	English
topic	TK Electrical engineering Electronics Nuclear engineering
spellingShingle	TK Electrical engineering Electronics Nuclear engineering Chuah, Andrew Hooi Leong Iterative diagnosis to improve diagnostic resolution
description	The area of research is the study of iterative diagnosis. Diagnosis to find faults in semiconductor devices is a well researched field, with most logic diagnosis efforts using the inject-and-evaluate algorithm. However, most diagnosis tools are unable to resolve faults to a single gate/device. Because of this, fault isolation (FI) engineers are forced to use probing techniques such as IREM logic state imaging (LSI) in order to further isolate the fault to the gate/device level before performing failure analysis. The current method of selecting probe sites is simply to take the list of fault candidates and probe them sequentially or by determining the optimal probe order through manual analysis of the circuit cone. However, in cases where a large list of fault candidates are returned by the diagnosis tool, it is difficult to manually analyze the fault cone as it is too large and complex. This work implements a basic algorithm which allows the diagnosis tool to recommend probe candidates, read in the result of the probe, and continue this cycle iteratively until the fault is fully isolated to a single gate/device. The algorithm is based on a binary search, and shows that a 5-6X reduction in the amount of probing needed can be achieved if the diagnosis tool is used iteratively in the fault isolation flow.
format	Thesis
qualification_level	Master's degree
author	Chuah, Andrew Hooi Leong
author_facet	Chuah, Andrew Hooi Leong
author_sort	Chuah, Andrew Hooi Leong
title	Iterative diagnosis to improve diagnostic resolution
title_short	Iterative diagnosis to improve diagnostic resolution
title_full	Iterative diagnosis to improve diagnostic resolution
title_fullStr	Iterative diagnosis to improve diagnostic resolution
title_full_unstemmed	Iterative diagnosis to improve diagnostic resolution
title_sort	iterative diagnosis to improve diagnostic resolution
granting_institution	Universiti Teknologi Malaysia, Faculty of Electrical Engineering
granting_department	Faculty of Electrical Engineering
publishDate	2013
url	http://eprints.utm.my/id/eprint/33800/5/AndrewChuahHooiLeongMFKE2013.pdf
_version_	1747816188231024640

Iterative diagnosis to improve diagnostic resolution

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