Time dependence of morphological and optical properties of DC sputtering grown copper oxide thin film

Copper oxide thin films with five different deposition times (30 min, 60 min, 90 min, 120 min and 150 min) had been successfully growth by dc sputtering technique. The thickness of copper oxide thin film was measured by using ellipsometer. The optical properties of copper oxide thin films were chara...

Full description

Saved in:

Bibliographic Details
Main Author:	Sulaiman, Rosmaizatul Akma
Format:	Thesis
Language:	English
Published:	2014
Subjects:	Q Science (General)
Online Access:	http://eprints.utm.my/id/eprint/47972/25/RosmaizatulAkmaSulaimanMFS2014.pdf
Tags:	Add Tag No Tags, Be the first to tag this record!

id	my-utm-ep.47972
record_format	uketd_dc
spelling	my-utm-ep.479722017-08-10T10:45:01Z Time dependence of morphological and optical properties of DC sputtering grown copper oxide thin film 2014-06 Sulaiman, Rosmaizatul Akma Q Science (General) Copper oxide thin films with five different deposition times (30 min, 60 min, 90 min, 120 min and 150 min) had been successfully growth by dc sputtering technique. The thickness of copper oxide thin film was measured by using ellipsometer. The optical properties of copper oxide thin films were characterized by UV-Vis-NIR spectrometer and Photoluminescence spectrometer while the morphology images were determined by Atomic Force Microscopy (AFM). The copper oxide thin film thicknesses were found around 11.6 nm, 122.1 nm, 129.7 nm, 142.4 nm and 144.2 nm with respect to the five different depositions time at 30 min time interval. The absorption and transmission spectra obtained from UV-Vis-NIR spectroscopy revealed five absorption edges of copper oxide thin film in the ultraviolet region. The optical absorption intensity was increased with increase the thickness while the transmission intensity was decreased with increase the thickness. The transmission intensity was increased to 90% for copper oxide with deposition time 30 min, 60 min, 90 min, and 120 min while the transmission intensity of copper oxide with deposition time 150 min was increased up to 75%. Based on the absorption coefficient measurements, the optical band gap energy have been determined by Tauc plot relation around Eg= 4.63 eV to 4.18 eV for 30 min to 150 min of deposition time. The photoluminescence spectra of copper oxide thin film was found in violet region (400 nm and 402 nm) for copper oxide thin film with deposition time 30 min and 60 min while the blue region (435 nm) was found for copper oxide thin film at deposition time 90 min, 120 min and 150 min. The root mean square roughness (RMS) was confirmed that the surface roughness of copper oxide thin film was increased with increase the deposition time and compatible with the images shown by Atomic Force Microscopy (AFM). 2014-06 Thesis http://eprints.utm.my/id/eprint/47972/ http://eprints.utm.my/id/eprint/47972/25/RosmaizatulAkmaSulaimanMFS2014.pdf application/pdf en public masters Universiti Teknologi Malaysia, Faculty of Science Faculty of Science
institution	Universiti Teknologi Malaysia
collection	UTM Institutional Repository
language	English
topic	Q Science (General)
spellingShingle	Q Science (General) Sulaiman, Rosmaizatul Akma Time dependence of morphological and optical properties of DC sputtering grown copper oxide thin film
description	Copper oxide thin films with five different deposition times (30 min, 60 min, 90 min, 120 min and 150 min) had been successfully growth by dc sputtering technique. The thickness of copper oxide thin film was measured by using ellipsometer. The optical properties of copper oxide thin films were characterized by UV-Vis-NIR spectrometer and Photoluminescence spectrometer while the morphology images were determined by Atomic Force Microscopy (AFM). The copper oxide thin film thicknesses were found around 11.6 nm, 122.1 nm, 129.7 nm, 142.4 nm and 144.2 nm with respect to the five different depositions time at 30 min time interval. The absorption and transmission spectra obtained from UV-Vis-NIR spectroscopy revealed five absorption edges of copper oxide thin film in the ultraviolet region. The optical absorption intensity was increased with increase the thickness while the transmission intensity was decreased with increase the thickness. The transmission intensity was increased to 90% for copper oxide with deposition time 30 min, 60 min, 90 min, and 120 min while the transmission intensity of copper oxide with deposition time 150 min was increased up to 75%. Based on the absorption coefficient measurements, the optical band gap energy have been determined by Tauc plot relation around Eg= 4.63 eV to 4.18 eV for 30 min to 150 min of deposition time. The photoluminescence spectra of copper oxide thin film was found in violet region (400 nm and 402 nm) for copper oxide thin film with deposition time 30 min and 60 min while the blue region (435 nm) was found for copper oxide thin film at deposition time 90 min, 120 min and 150 min. The root mean square roughness (RMS) was confirmed that the surface roughness of copper oxide thin film was increased with increase the deposition time and compatible with the images shown by Atomic Force Microscopy (AFM).
format	Thesis
qualification_level	Master's degree
author	Sulaiman, Rosmaizatul Akma
author_facet	Sulaiman, Rosmaizatul Akma
author_sort	Sulaiman, Rosmaizatul Akma
title	Time dependence of morphological and optical properties of DC sputtering grown copper oxide thin film
title_short	Time dependence of morphological and optical properties of DC sputtering grown copper oxide thin film
title_full	Time dependence of morphological and optical properties of DC sputtering grown copper oxide thin film
title_fullStr	Time dependence of morphological and optical properties of DC sputtering grown copper oxide thin film
title_full_unstemmed	Time dependence of morphological and optical properties of DC sputtering grown copper oxide thin film
title_sort	time dependence of morphological and optical properties of dc sputtering grown copper oxide thin film
granting_institution	Universiti Teknologi Malaysia, Faculty of Science
granting_department	Faculty of Science
publishDate	2014
url	http://eprints.utm.my/id/eprint/47972/25/RosmaizatulAkmaSulaimanMFS2014.pdf
_version_	1747817276522889216

Time dependence of morphological and optical properties of DC sputtering grown copper oxide thin film

Similar Items