APA (7th ed.) Citation

Alamgir, A. (2016). Test vectors reductoin for integrated circuit testing using horizontal hamming distance.

Chicago Style (17th ed.) Citation

Alamgir, Arbab. Test Vectors Reductoin for Integrated Circuit Testing Using Horizontal Hamming Distance. 2016.

MLA (8th ed.) Citation

Alamgir, Arbab. Test Vectors Reductoin for Integrated Circuit Testing Using Horizontal Hamming Distance. 2016.

Warning: These citations may not always be 100% accurate.