APA引文

Alamgir, A. (2016). Test vectors reductoin for integrated circuit testing using horizontal hamming distance.

Chicago Style (17th ed.) Citation

Alamgir, Arbab. Test Vectors Reductoin for Integrated Circuit Testing Using Horizontal Hamming Distance. 2016.

MLA引文

Alamgir, Arbab. Test Vectors Reductoin for Integrated Circuit Testing Using Horizontal Hamming Distance. 2016.

警告：這些引文格式不一定是100％准確.