Hybrid constraint-based test pattern generation
The role of testing in Integrated circuit (IC) is to determine the correctness of manufactured circuits. Therefore, testing is important since the fraction of good chips sold in the market yields the quality of the product. Automatic test equipment (ATE) is equipment that used in manufacturing test....
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Main Author: | Abdullah, Ayub Chin |
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Format: | Thesis |
Language: | English |
Published: |
2013
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Subjects: | |
Online Access: | http://eprints.utm.my/id/eprint/78117/1/AyubChinAbdullahMFKE20131.pdf |
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