Equipment and process performance improvement using automated monitoring system

Factories are faced with many challenges especially with the increased product complexity along with tightened quality, yield and productivity indicators. Engineers working on maintaining, troubleshooting, design/improving equipments and process always lack of efficient tool to help them track equip...

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Main Author: Poobalan, Prakash
Format: Thesis
Language:English
Published: 2009
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Online Access:http://eprints.utm.my/id/eprint/9865/1/PrakashPoobalanMFKM2009.pdf
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spelling my-utm-ep.98652018-06-13T07:07:55Z Equipment and process performance improvement using automated monitoring system 2009-05 Poobalan, Prakash TJ Mechanical engineering and machinery TS Manufactures Factories are faced with many challenges especially with the increased product complexity along with tightened quality, yield and productivity indicators. Engineers working on maintaining, troubleshooting, design/improving equipments and process always lack of efficient tool to help them track equipment state and improve the utilization. The Overall Equipment Effectiveness metric (OEE) is a very powerful tool that can be used to measure productivity at equipment level. Previous research has shown that OEE’s along with accurate and consistent equipment state data can be combined with process parameters to give estimates of productivity at the factory level. A factory monitoring tool that facilitates the analysis of a manufacturing system, by integrating KPIV and OEE metrics is studied in this project. Such a system allows factory professionals to analyze system performance by automatically evaluating the productivity metrics of equipment using the tool. This is extended to evaluate the metrics at subsystem level and thereon to the factory level and also to detect the bottleneck elements in the system. This tool paves way for further research on continuous productivity improvement methods development. 2009-05 Thesis http://eprints.utm.my/id/eprint/9865/ http://eprints.utm.my/id/eprint/9865/1/PrakashPoobalanMFKM2009.pdf application/pdf en public masters Universiti Teknologi Malaysia Faculty of Mechanical Engineering 1. W.J. Trybula, and Margaret Pratt. (1994). Applying SEMI El0 Guidelines to Manufacturing. Proceedings 1994 IEMT Symposium., Sixteenth IEEE/CPMT International. 12-14 Sep 1994. La Jolla, CA, USA, 309-310 2. Nakajima, S. (1988), Introduction to TPM, Productivity Press, Cambridge, MA. 3. Naguib and Schlueter. (1994) Conflicting Goals or Increasing Opportunities. Semiconductor Manufacturing Conference and Workshop, 1994. IEEE/SEMI, Volume , Issue , 23-25 Sep 1994, 55 – 60 4. Semiconductor Equipment and Materials International (SEMI). (1986). SEMI E10 Guidelines. San Jose, USA : SEMI 5. John Konopka and Walt Trybula. (1995). Utilizing Production Data to Increase Factory Capacity. IEEE/CPMT Int'l Electronics Manufacturing Technology Symposium. Sept. Montopolis Drive, Austin, 292-294 6. Wang, Qingsu, Zvonar, John, Simpson, and Mike. (1998). United States Paten No. 574,0429 Washington DC: U.S. Patent and Trademark Office. 7. Sheta, A. F. and De Jong, K. (1996). Parameter Estimation of Nonlinear Systems in Noisy Environments Using Genetic Algorithms. Proceedings of the 1996 IEEE International Symposium on Intelligent Control. 15-18 September. Dearborn, Michigan: IEEE, 360 - 365. 8. Tom Pomorski. (1997). Managing Overall Equipment Effectiveness (OEE) to Optimize Factory Performance. Semiconductor Manufacturing Conference Proceedings, 1997 IEEE International Symposium. 6-8 Oct 1997. South Portland, Maine, USA : IEEE, A33 - A36 9. V. A. Ames, Jerry Gililland, John Konopka, and Rich Schnabl. (1995) Overall Equipment Effectiveness (OEE) Guidebook. SEMATECH 10. Laura Peters. (2004). Tighter Equipment Tracking for efficient Fabs. Semiconductor International, 2004 11. Konopka, J.M. (1995). Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions, Sep 1995. 484 - 491 12. Yuri Karzhavin. (2000). Productivity Improvement Focus at White Oak Semiconductor. IEEE, 2000 13. K. M. N. Muthiah and S. H. Huang. (2007) Overall throughput effectiveness (OTE) metric for factory-level performance monitoring and bottleneck detection. International Journal of Production Research. 2007
institution Universiti Teknologi Malaysia
collection UTM Institutional Repository
language English
topic TJ Mechanical engineering and machinery
TS Manufactures
spellingShingle TJ Mechanical engineering and machinery
TS Manufactures
Poobalan, Prakash
Equipment and process performance improvement using automated monitoring system
description Factories are faced with many challenges especially with the increased product complexity along with tightened quality, yield and productivity indicators. Engineers working on maintaining, troubleshooting, design/improving equipments and process always lack of efficient tool to help them track equipment state and improve the utilization. The Overall Equipment Effectiveness metric (OEE) is a very powerful tool that can be used to measure productivity at equipment level. Previous research has shown that OEE’s along with accurate and consistent equipment state data can be combined with process parameters to give estimates of productivity at the factory level. A factory monitoring tool that facilitates the analysis of a manufacturing system, by integrating KPIV and OEE metrics is studied in this project. Such a system allows factory professionals to analyze system performance by automatically evaluating the productivity metrics of equipment using the tool. This is extended to evaluate the metrics at subsystem level and thereon to the factory level and also to detect the bottleneck elements in the system. This tool paves way for further research on continuous productivity improvement methods development.
format Thesis
qualification_level Master's degree
author Poobalan, Prakash
author_facet Poobalan, Prakash
author_sort Poobalan, Prakash
title Equipment and process performance improvement using automated monitoring system
title_short Equipment and process performance improvement using automated monitoring system
title_full Equipment and process performance improvement using automated monitoring system
title_fullStr Equipment and process performance improvement using automated monitoring system
title_full_unstemmed Equipment and process performance improvement using automated monitoring system
title_sort equipment and process performance improvement using automated monitoring system
granting_institution Universiti Teknologi Malaysia
granting_department Faculty of Mechanical Engineering
publishDate 2009
url http://eprints.utm.my/id/eprint/9865/1/PrakashPoobalanMFKM2009.pdf
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