An efficient march (5n) FSM-based Memory Built-in Self-Test (MBIST) architecture with diagnosis capabilities
In deep submicron Systems-on-Chip, embedded memories are consuming a growing part of the die area. The manufacturing test of embedded memory is a critical stage in the SoC production process that screens out faulty chips and speeds up the volume production of new manufacturing technology. Memory Bui...
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Main Author: | Ng, Kok Heng |
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Format: | Thesis |
Language: | English |
Published: |
2022
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Subjects: | |
Online Access: | http://eprints.utm.my/id/eprint/99546/1/NgKokHengMSKE2022.pdf |
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