Negative bias temperature instability and permittivity dependent delay mitigation in High-K metal oxide compatible cmos dielectric /

مواد مشابهة

• Characterization of pmosfet degradation in negative bias temperature instability test /
  بواسطة: Soon, Foo Yew
  منشور في: (2012)
• Defectivity improvement in advanced processes and its investigation to negative bias temperature instabilities in High-K/Metal-Gate Deep-Submicron CMOS /
  بواسطة: Yasmin Abdul Wahab
  منشور في: (2015)
• Static current and voltage techniques for CMOS reliability characterization /
  بواسطة: Jie, Bin Bin
  منشور في: (1999)
• Design of a wide-range CMOS digital delay line with sub-picosecond jitter for image sensor applications
  بواسطة: Abdulrazzaq, Bilal Isam
  منشور في: (2016)
• CMOS compatible vertical surround gate mosfets with reduced parasitics /
  بواسطة: Kunz, Veit Dominik
  منشور في: (2003)