Negative bias temperature instability and permittivity dependent delay mitigation in High-K metal oxide compatible cmos dielectric /

Negative bias temperature instability and permittivity dependent delay mitigation in High-K metal oxide compatible cmos dielectric /

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書目詳細資料
主要作者:	Karim, Nissar Mohammad (Author)
格式:	Thesis 圖書
語言:	English
出版:	2015.
主題:	Metal oxide semiconductors, Complementary.
在線閱讀:	http://studentsrepo.um.edu.my/id/eprint/7563
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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