APA引文

Sim, K. S. (1990). Electron beam testing of integrated circuits using a modified scanning electron microscope.

Chicago Style (17th ed.) Citation

Sim, Kian Sin. Electron Beam Testing of Integrated Circuits Using a Modified Scanning Electron Microscope. 1990.

MLA引文

Sim, Kian Sin. Electron Beam Testing of Integrated Circuits Using a Modified Scanning Electron Microscope. 1990.

警告：這些引文格式不一定是100％准確.