Characterization of deposited Yttrium oxide films /
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Format: | Thesis Book |
Language: | English |
Published: |
1993.
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LEADER | 00742cam a2200229 a 4500 | ||
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001 | u361918 | ||
003 | SIRSI | ||
008 | 941025s1993 si v 00 1 eng m | ||
035 | |a ABU-2360 | ||
040 | |a UMM | ||
090 | |a QC611.98 |b Y3Bha | ||
100 | 0 | 0 | |a Bhaskaran Jayachandran. |
245 | 1 | 0 | |a Characterization of deposited Yttrium oxide films / |c by Bhaskaran Jayachandran. |
260 | |c 1993. | ||
300 | |a xv, 119, [24] leaves : |b ill. ; |c 30 cm. | ||
502 | |a Dissertation (M.Eng.) -- National University of Singapore, 1993. | ||
504 | |a Bibliography: leaves 117-119. | ||
650 | 0 | |a Yttrium oxide. | |
650 | 0 | |a Thin films. | |
948 | |a 25/10/1994 |b 17/08/1998 | ||
596 | |a 1 | ||
999 | |a QC611.98 Y3BHA |w LC |c 1 |i A504804546 |l STACKS |m P01UTAMA |r Y |s Y |t TESIS |u 20/7/1995 |