Koh, L. (1994). A spectroscopic photoemission microscopy system for semiconductor device analysis.
Chicago Style (17th ed.) CitationKoh, Lian-Ser. A Spectroscopic Photoemission Microscopy System for Semiconductor Device Analysis. 1994.
MLA引文Koh, Lian-Ser. A Spectroscopic Photoemission Microscopy System for Semiconductor Device Analysis. 1994.
警告:这些引文格式不一定是100%准确.