A spectroscopic photoemission microscopy system for semiconductor device analysis /
Saved in:
| Main Author: | Koh, Lian-Ser |
|---|---|
| Format: | Thesis Book |
| Language: | English |
| Published: |
1994.
|
| Subjects: | |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Structural and electronic properties of advanced materials : photoemission and first principles calculations /
by: Zheng, Jincheng
Published: (2001) -
Carrier diffusion effects in semiconductor nonlinear optical devices /
Published: (1985) -
Optical absorption studies of heavily doped silicon /
by: Aw, Siew Eng
Published: (1986) -
Nuclear microscopy of wide band gap semiconductors /
by: Teo, Ee Jin
Published: (2002) -
Registration of positron emission tomography (PET) image and functional near infrared spectroscopy (fNIRS) data
by: Fairuz Mohd Nasir
