A study on integrated circuits I-V characteristics using fault localization system /
Saved in:
| Main Author: | |
|---|---|
| Format: | Thesis Book |
| Language: | English |
| Published: |
1995.
|
| Subjects: | |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| LEADER | 00764cam a2200217 a 4500 | ||
|---|---|---|---|
| 001 | u378219 | ||
| 003 | SIRSI | ||
| 008 | 950803s1995 si v 00 0 eng m | ||
| 035 | |a ABW-8580 | ||
| 040 | |a UMM | ||
| 090 | |a TK7874 |b Qua | ||
| 100 | 1 | 0 | |a Quah, Larry Thiam Soon |
| 245 | 1 | 2 | |a A study on integrated circuits I-V characteristics using fault localization system / |c by Larry Quah Thiam Soon. |
| 260 | |c 1995. | ||
| 300 | |a xiv, 108 leaves : |b ill. ; |c 30 cm. | ||
| 502 | |a Dissertation (M.Sc.) -- National University of Singapore, 1995. | ||
| 504 | |a Bibliography: leaves 102-103. | ||
| 650 | 0 | |a Integrated circuits |x Large scale integration. | |
| 948 | |a 03/08/1995 |b 25/11/2000 | ||
| 596 | |a 1 | ||
| 999 | |a F TK7874 QUA |w LC |c 1 |i A505564394 |l STACKS |m P01UTAMA |r Y |s Y |t TESIS |u 23/4/1996 | ||