Modelling and simulation of hot-carrier degradation in submicrometre MOS transistors /
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| Main Author: | |
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| Format: | Thesis Book |
| Language: | English |
| Published: |
1995.
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| Subjects: | |
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| LEADER | 00940cam a2200253 a 4500 | ||
|---|---|---|---|
| 001 | u385466 | ||
| 003 | SIRSI | ||
| 008 | 951017s1995 si v 00 1 eng m | ||
| 035 | |a ABX-9617 | ||
| 040 | |a UMM | ||
| 090 | |a TK7871.99 |b M44Sea | ||
| 100 | 1 | 0 | |a Seah, Boon Pian. |
| 245 | 1 | 0 | |a Modelling and simulation of hot-carrier degradation in submicrometre MOS transistors / |c by Seah Boon Pian. |
| 260 | |c 1995. | ||
| 300 | |a 1 v. (various pagings) : |b ill. ; |c 30 cm. | ||
| 502 | |a Dissertation (M.Eng.) -- National University of Singapore, 1995. | ||
| 504 | |a Includes bibliographical references. | ||
| 650 | 0 | |a Metal oxide semiconductors |x Mathematical models | |
| 650 | 0 | |a Integrated circuits |x Very large scale integration. | |
| 650 | 0 | |a Hot carriers. | |
| 650 | 0 | |a Semiconductor storage devices. | |
| 948 | |a 17/10/1995 |b 17/08/1998 | ||
| 596 | |a 1 | ||
| 999 | |a F TK7871.99 M44SEA |w LC |c 1 |i A505564563 |d 26/1/2001 |l STACKS |m P01UTAMA |n 2 |r Y |s Y |t TESIS |u 22/4/1996 | ||