A built-in self-testable bit-slice processor /

A built-in self-testable bit-slice processor /

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書目詳細資料
主要作者:	Ibrahim Abubakr M.
格式:	Thesis 圖書
語言:	English
出版:	1995.
主題:	Integrated circuits > Very large scale integration > Testing Integrated circuits > Testing. Microprocessors > Testing
在線閱讀:	http://studentsrepo.um.edu.my/id/eprint/2392
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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