A correlation of oxide trap density and TDDB characteristics of very thin SiO2 films /
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| Main Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
1995.
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| Subjects: | |
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| Physical Description: | xii, 107 leaves : ill. ; 30 cm. |
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| Bibliography: | Bibliography: leaves 103-107. |