Electrical characterisation of MOS gate oxide /
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| Main Author: | |
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| Format: | Thesis Book |
| Language: | English |
| Published: |
1996.
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| Subjects: | |
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| LEADER | 00789cam a2200241 a 4500 | ||
|---|---|---|---|
| 001 | u406013 | ||
| 003 | SIRSI | ||
| 008 | 970102s1996 si v 00 1 eng m | ||
| 035 | |a ACB-9574 | ||
| 040 | |a UMM | ||
| 090 | |a TK7871.99 |b M44Ooi | ||
| 100 | 1 | 0 | |a Ooi, Joo Aik. |
| 245 | 1 | 0 | |a Electrical characterisation of MOS gate oxide / |c by Ooi Joo Aik. |
| 260 | |c 1996. | ||
| 300 | |a xii, 89, [2] leaves : |b ill. ; |c 30 cm. | ||
| 502 | |a Dissertation (M.Eng.) -- National University of Singapore, 1996. | ||
| 504 | |a Includes bibliographical references. | ||
| 650 | 0 | |a Metal oxide semiconductors. | |
| 650 | 0 | |a Capacitors. | |
| 650 | 0 | |a Dielectric devices | |
| 948 | |a 02/01/1997 |b 31/07/1998 | ||
| 596 | |a 1 | ||
| 999 | |a TK7871.99 M44OOI |w LC |c 1 |i A506477718 |d 11/3/1999 |l STACKS |m P01UTAMA |n 2 |r Y |s Y |t TESIS |u 30/1/1997 | ||
