APA引文

Wu, Z. (1996). Computer controlled transient capacitance measurement and analysis of deep levels in semiconductors.

Chicago Style (17th ed.) Citation

Wu, Zongmin. Computer Controlled Transient Capacitance Measurement and Analysis of Deep Levels in Semiconductors. 1996.

MLA引文

Wu, Zongmin. Computer Controlled Transient Capacitance Measurement and Analysis of Deep Levels in Semiconductors. 1996.

警告：这些引文格式不一定是100％准确.