Computer controlled transient capacitance measurement and analysis of deep levels in semiconductors /
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| Main Author: | |
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| Format: | Thesis Book |
| Language: | English |
| Published: |
1996.
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| Subjects: | |
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| LEADER | 00851cam a2200241 a 4500 | ||
|---|---|---|---|
| 001 | u406113 | ||
| 003 | SIRSI | ||
| 008 | 970103s1996 si v 00 10 eng m | ||
| 035 | |a ACB-9776 | ||
| 040 | |a UMM | ||
| 090 | |a QC611.6 |b D4Wu | ||
| 100 | 1 | 0 | |a Wu, Zongmin. |
| 245 | 1 | 0 | |a Computer controlled transient capacitance measurement and analysis of deep levels in semiconductors / |c by Wu Zongmin. |
| 260 | |c 1996. | ||
| 300 | |a ii, 91, 58 leaves : |b ill. ; |c 30 cm. | ||
| 502 | |a Dissertation (M.Sc.) -- National University of Singapore, 1996. | ||
| 504 | |a Bibliography: leaves 88-91. | ||
| 650 | 0 | |a Semiconductors |x Defects |x Measurement. | |
| 650 | 0 | |a Semiconductors |x Impurities. | |
| 650 | 0 | |a Capacitance meters |x Data processing. | |
| 948 | |a 03/01/1997 |b 25/11/2000 | ||
| 596 | |a 1 | ||
| 999 | |a QC611.6 D4WU |w LC |c 1 |i A506477530 |l STACKS |m P01UTAMA |r Y |s Y |t TESIS |u 28/4/1997 | ||