APA引文

Ge, L. X. (1997). Photon emission microscope systems for integrated circuit failure analysis.

Chicago Style (17th ed.) Citation

Ge, Li Xin. Photon Emission Microscope Systems for Integrated Circuit Failure Analysis. 1997.

MLA引文

Ge, Li Xin. Photon Emission Microscope Systems for Integrated Circuit Failure Analysis. 1997.

警告：这些引文格式不一定是100％准确.