Photon emission microscope systems for integrated circuit failure analysis /
Saved in:
| 主要作者: | Ge, Li Xin |
|---|---|
| 格式: | Thesis 圖書 |
| 語言: | English |
| 出版: |
1997.
|
| 主題: | |
| 標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|
相似書籍
-
Determination of optimal filter function for single-photon emission computed tomography (spect) : based on selected studies /
由: Mohamed Sani Alizain
出版: (1996) -
A study of hot-carrier effects using photon emission spectroscopy /
由: Tao, Jing Mei
出版: (1997) -
A multi-pixel CMOS photon detector for the scanning electron microscope /
由: Joon, Huang Chuah
出版: (2012) -
The role of plain radiography, computed tomography (CT), and 99mTc-MDP single photon emission computed tomography (SPECT) in the evaluation of back pain /
由: Wong, Leong Wai
出版: (1996) -
Reducing the effects of scattered gamma photons in Tc-99m myocardial spect imaging
由: Nazifah Abdullah
