Tan, S. E. (1997). Evaluation of hot-carrier degradation in submicrometre MOSFETs by gate capacitance and charge pumping current measurements.
Chicago Style (17th ed.) CitationTan, Suat Eng. Evaluation of Hot-carrier Degradation in Submicrometre MOSFETs by Gate Capacitance and Charge Pumping Current Measurements. 1997.
MLA (8th ed.) CitationTan, Suat Eng. Evaluation of Hot-carrier Degradation in Submicrometre MOSFETs by Gate Capacitance and Charge Pumping Current Measurements. 1997.
Warning: These citations may not always be 100% accurate.