APA引文

Tan, S. E. (1997). Evaluation of hot-carrier degradation in submicrometre MOSFETs by gate capacitance and charge pumping current measurements.

Chicago Style (17th ed.) Citation

Tan, Suat Eng. Evaluation of Hot-carrier Degradation in Submicrometre MOSFETs by Gate Capacitance and Charge Pumping Current Measurements. 1997.

MLA引文

Tan, Suat Eng. Evaluation of Hot-carrier Degradation in Submicrometre MOSFETs by Gate Capacitance and Charge Pumping Current Measurements. 1997.

警告：这些引文格式不一定是100％准确.