Evaluation of hot-carrier degradation in submicrometre MOSFETs by gate capacitance and charge pumping current measurements /

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Bibliographic Details
Main Author: Tan, Suat Eng
Format: Thesis Book
Language:English
Published: 1997.
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Description
Physical Description:xxxii, 191 leaves : ill. ; 30 cm.
Bibliography:Bibliography: leaves 159-182.