Evaluation of hot-carrier degradation in submicrometre MOSFETs by gate capacitance and charge pumping current measurements /

مواد مشابهة

• Hot-carrier degradation study in MOSFET's by charge pumping, gated-diode and floating gate techniques /
  بواسطة: Goh, Yong Han
  منشور في: (1997)
• Hot-carrier effects in thin gate oxide MOSFET's /
  بواسطة: See, Leng Kian
  منشور في: (1998)
• Hot-carrier studies in submicrometer SOI and conventional MOSFETs /
  بواسطة: Yip, Anselm
  منشور في: (1998)
• Characterization of hot-carrier degradation in submicrometer MOS transistors /
  بواسطة: Ang, Diing Shenp
  منشور في: (1997)
• A study of hot-carrier degradation in nitrided and conventional oxides /
  بواسطة: Goo, Kah Heong
  منشور في: (1998)