Electrical characterization of N[2]O annealed gate oxide /
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| Main Author: | |
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| Format: | Thesis Book |
| Language: | English |
| Published: |
1997.
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| Subjects: | |
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| LEADER | 00773cam a2200241 a 4500 | ||
|---|---|---|---|
| 001 | u422596 | ||
| 003 | SIRSI | ||
| 008 | 980404s1997 si v 00 1 eng m | ||
| 035 | |a ACE-9016 | ||
| 040 | |a UMM | ||
| 090 | |a TK7871.85 |b Dai | ||
| 100 | 1 | 0 | |a Dai, Feng. |
| 245 | 1 | 0 | |a Electrical characterization of N[2]O annealed gate oxide / |c by Dai Feng. |
| 260 | |c 1997. | ||
| 300 | |a xii, 77 leaves : |b ill. ; |c 30 cm. | ||
| 500 | |a [2] is in subscript. | ||
| 502 | |a Dissertation (M.Eng.) -- National University of Singapore, 1997. | ||
| 504 | |a Bibliography: leaves 73-74. | ||
| 650 | 0 | |a Semiconductors |x Electric properties | |
| 650 | 0 | |a Nitrous oxide. | |
| 948 | |a 04/04/1998 |b 08/04/1999 | ||
| 596 | |a 1 | ||
| 999 | |a TK7871.85 DAI |w LC |c 1 |i A507504945 |l STACKS |m P01UTAMA |r Y |s Y |t TESIS |u 28/8/1998 | ||