Statistical yield analysis for IC manufacturing /
محفوظ في:
| المؤلف الرئيسي: | |
|---|---|
| التنسيق: | أطروحة كتاب |
| اللغة: | English |
| منشور في: |
1997.
|
| الموضوعات: | |
| الوسوم: |
إضافة وسم
لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!
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| LEADER | 00771cam a2200217 a 4500 | ||
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| 001 | u423067 | ||
| 003 | SIRSI | ||
| 008 | 930423s1997 my ab v 00 1 eng m | ||
| 035 | |a ACE-9716 | ||
| 040 | |a UMM | ||
| 090 | |a TK7874 |b Yam | ||
| 100 | 1 | 0 | |a Yam, Hong See. |
| 245 | 1 | 0 | |a Statistical yield analysis for IC manufacturing / |c Yam Hong See. |
| 260 | |c 1997. | ||
| 300 | |a 1 v. (various pagings) : |b ill ; |c 29 cm. | ||
| 502 | |a Dissertation (M.Sc.) -- National University of Singapore, 1997. | ||
| 504 | |a Includes bibliographical references. | ||
| 650 | 0 | |a Integrated circuits |x Design and construction |x Quality control |x Statistical methods | |
| 948 | |a 20/04/1998 |b 01/04/2004 | ||
| 596 | |a 1 | ||
| 999 | |a TK7874 YAM |w LC |c 1 |i A508645149 |d 24/5/2000 |l STACKS |m P01UTAMA |n 8 |r Y |s Y |t TESIS |u 12/4/1999 | ||