APA引文

Li, O. (1997). Charging effects in low-voltage scanning electron microscope metrology.

Chicago Style (17th ed.) Citation

Li, Ou. Charging Effects in Low-voltage Scanning Electron Microscope Metrology. 1997.

MLA引文

Li, Ou. Charging Effects in Low-voltage Scanning Electron Microscope Metrology. 1997.

警告：這些引文格式不一定是100％准確.