Electrical test optimization for integrated circuit (IC) devices to improve productivity, cycle time and product cost /
محفوظ في:
| المؤلف الرئيسي: | |
|---|---|
| التنسيق: | أطروحة كتاب |
| اللغة: | English |
| منشور في: |
1997.
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| الموضوعات: | |
| الوسوم: |
إضافة وسم
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| 001 | u431594 | ||
| 003 | SIRSI | ||
| 008 | 910522s1997 my t 00 1 eng m | ||
| 035 | |a ACG-1030 | ||
| 040 | |a UMJ | ||
| 097 | |a TK7874.6 |b Siv | ||
| 100 | 0 | 0 | |a Siva Raman |
| 245 | 1 | 0 | |a Electrical test optimization for integrated circuit (IC) devices to improve productivity, cycle time and product cost / |c Siva Raman |
| 260 | |c 1997. | ||
| 300 | |a vii, 59 leaves : |b ill. ; |c 29 cm. | ||
| 500 | |a Photocopy. | ||
| 502 | |a Dissertation (M. Eng.) -- Fakulti Kejuruteraan, Universiti Malaya, 1997. | ||
| 504 | |a Includes bibliographical references. | ||
| 650 | 0 | |a Integrated circuits | |
| 650 | 0 | |a Electric apparatus and appliances |x Testing | |
| 710 | 2 | 0 | |a Universiti Malaya. |b Jabatan Kejuruteraan Mekanik |
| 948 | |a 18/11/1998 |b 30/12/1998 | ||
| 596 | |a 7 | ||
| 999 | |a TK7874.6 SIV |w LC |c 1 |i A501580678 |l STACKS |m P07JURUTER |r Y |s Y |t TESIS |u 30/12/1998 | ||